OSNR Sensitivity Analysis for Si-Ge Avalanche Photodiodes
Published in IEEE Photonics Technology Letters, 2022
Recommended citation: Yuan Yuan, Sudharsanan Srinivasan, Yiwei Peng, Di Liang, Zhihong Huang, Wayne V Sorin, Stanley Cheung, Marco Fiorentino, and Raymond G Beausoleil. "OSNR Sensitivity Analysis for Si-Ge Avalanche Photodiodes." IEEE Photonics Technology Letters 34, no. 6 (2022): 321-324. https://ieeexplore.ieee.org/abstract/document/9718330/
We investigate the bit error rates and eye diagrams of Si-Ge avalanche photodiodes at 32 Gb/s NRZ for different optical signal-to-noise ratios. The relationship between receiver sensitivity and optical signals quality has been analyzed using theoretical calculation and simulation. This sensitivity analysis provides guidance on signal quality tolerances for the APD-based optical links.
Recommended citation: Yuan Yuan, Sudharsanan Srinivasan, Yiwei Peng, Di Liang, Zhihong Huang, Wayne V Sorin, Stanley Cheung, Marco Fiorentino, and Raymond G Beausoleil. “OSNR Sensitivity Analysis for Si-Ge Avalanche Photodiodes.” IEEE Photonics Technology Letters 34, no. 6 (2022): 321-324.