Talks and Conferences

III-V Compound Avalanche Photodiodes on Silicon

July 29, 2019

Conference Talk, Integrated Photonics Research, Silicon and Nanophotonics (IPR), Burlingame, California

We demonstrate the first III-V avalanche photodiodes grown directly on silicon byheteroepitaxy. The InGaAs/InAlAs APD exhibits gain >20, low dark current, quantum efficiency >40%, and low excess noise (k value ~ 0.2).

Comparison of excess noise in InAlAs and AlGaAs digital and random alloy avalanche photodiodes

September 30, 2018

Conference Talk, IEEE Photonics Conference (IPC), Reston, Virginia

Digital alloy In0.52Al0.48 As avalanche photodiodes exhibit lower excess noise than those fabricated from random alloys. This paper compares the temperature dependence, from 203K to 323K, of the impact ionization characteristics of In0.52Al0.48As and Al0.74Ga0.26As digital and random alloys. These results provide insight into the low excess noise exhibited by some digital alloy materials, and these materials can even obtain lower excess noise at low temperature.